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Hierarchical sequential testing11/11/2022 ![]() To the best of our knowledge, this is the first time that a decision diagram based soft error identification approach is proposed for asynchronous circuits. secondary endpoint testing when using traditional hierarchical testing Reference: Hung, Wang, O’Neill (JBS, 2007) Example: Test primary at alpha-spending level 1 and if significance is achieved at interim 1 Proceed to step-down to test secondary endpoint at 0. By ‘mainly driven’, we mean that the interim analyses are planned at. #Hierarchical sequential testing trialWe consider the situation of testing hierarchically a (key) secondary endpoint in a group-sequential clinical trial that is mainly driven by a primary endpoint. The proposed technique is capable to exhaustively identify soft error glitch propagation paths, which are then used to estimate the SER. Hierarchical testing of multiple endpoints in group-sequential trials. Results indicate that the proposed technique is on average 4.29 times faster than the best contemporary state-of-the-art techniques. Aiming at the problem of fault isolation in hierarchical systems,an optimization method of hierarchical sequential testing was presented.Firstly,a mathematic model was constructed to deal with fault isolation. To demonstrate the effectiveness of our technique, several ISCAS89 sequential and combinational benchmark circuits, and multiple asynchronous handshake circuits have been analyzed. Also, this methodology allows designers to apply radiation tolerance techniques on reduced sets of internal nodes. This work helps mitigate design for testability (DFT) issues in relation to identifying the controllable and the observable circuit nodes, when the circuit is subject to soft errors. The proposed methodology utilizes Multiway Decision Graphs (MDGs) and glitch-propagation sets (GP sets) to obtain soft error rate (SER) estimation at gate level. In this paper, we present a symbolic framework to model soft errors in both synchronous and asynchronous designs. Soft errors, due to cosmic radiations, are one of the major challenges for reliable VLSI designs. ![]()
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